Lecturer: Lodovico Ratti  

Course name: Electronic Instrumentation
Course code: 503269
Degree course: Ingegneria Elettronica
Disciplinary field of science: ING-INF/01
L'insegnamento è caratterizzante per: Ingegneria Elettronica
University credits: CFU 6
Course website: http://eil.unipv.it/strumentelePV/

Specific course objectives

The course provides a thorough overview of the available instrumentation for electronic device and circuit characterization, with particular reference to instrumentation for specialized research activities and electronic and microelectronic industry. Lectures are focused on the instrumentation operating principle, which is discussed also through the analysis of the relevant block and circuit schemes, on the application and on the main specifications, with some examples from commercial models. The course is also concerned with such topics as electronic noise and time interval measurements and charge amplitude measurements from capacitive detectors, aiming at shining some light on the most critical aspects and providing some design criteria for high performance instrumentation.

Course programme

Instrumentation for noise measurements in electronic devices and circuits
Measurements of noise spectral density in semiconductor devices. Instrumentation for noise spectral density measurements in MOSFETs, junction FETs and bipolar transistors.

Instrumentation for charge measurements from capacitive detectors
Charge measurements from capacitive sources. Equivalent noise charge (ENC). ENC measurements in electronic circuits processing the signals from capacitive sources.

Instrumentation for static and signal measurements in semiconductor devices
Switching times in diodes. Semiconductor devices characterization (Semiconductor Parameter Analyzer HP 4145B).

Automatic instrumentation for impedance measurements
LCR Impedance Analyzer (HP 4284A Precision LCR Meter).

Signal generators
Radiofrequency AM/FM signal generator. Phase-locked-loop circuits (PLL). Frequency synthesizers. Analog and digital pulse generators.

Signal analysis in the frequency domain
Real time (multichannel) spectrum analyzers. Swept-frequency (tunable filter or superheterodyne) spectrum analyzers. Dynamic signal analyzer. Analyzers applications and general performance.

Time domain signal analysis
Sampling scope, digital storage oscilloscope (DSO). Time domain reflectometry.

Instrumentation for signal parameters measurement
Definition of the parameters of some particular waveforms. Instrumentation for waveform parameters measurement: average rectified value, peak value and true RMS AC-DC converters. Instrumentation amplifier.

Instrumentation for time intervals measurement
Application examples. Systematic dependence of the firing delay on the signal parameters. Time-over-Threshold (ToT) method for charge measurements from capacitive sources. Noise effects on charge measurement accuracy with the ToT method.

Charge measurement devices in imaging and tracking applications
Operating principles of CMOS monolithic pixels. Passive monolithic pixels (PPS), active monolithic pixels (APS), logarithmic and photogate pixels. Readout architecture in monolithic pixels matrices. Readout time estimation.

Course entry requirements

Knowledge of the topics covered by the courses of Misure Elettroniche, Elettronica I and Comunicazioni Analogiche e Digitali or Comunicazioni Elettriche is required.

Course structure and teaching

Lectures (hours/year in lecture theatre): 44
Practical class (hours/year in lecture theatre): 0
Practicals / Workshops (hours/year in lecture theatre): 6

Suggested reading materials

C.F. Coombs. Electronic Instrument Handbook. McGraw-Hill, Inc, 2000.

J.J. Carr. Elements of Electronic Instrumentation and Measurements. McGraw-Hill, Inc., 1996.

W.D. Cooper, A. D. Helfrick. Electronic Instrumentation and Measurements Techniques. Prentice-Hall Intern., Inc., 1985.

B. Oliver, J. Cage. Electronic Measurements and Instrumentation. McGraw-Hill, 1971.

N. Kularatna. Digital and Analogue Instrumentation. The Institute of Electrical Engineers, 2003.

Lecture notes and transparencies are available on the website http://eil.unipv.it/strumentelePV.

Testing and exams

Student knowledge will be assessed through a written examination. Upon request of the candidate, an additional oral examination can be taken.