Lecturer: Lodovico Ratti  

Course name: Strumentazione elettronica
Course code: 064097
Degree course: Ingegneria Elettronica
Disciplinary field of science: ING-INF/01
The course relates to:
University credits: CFU 5
Course website: http://eil.unipv.it/strumentelePV

Specific course objectives

The course provides a thorough knowledge of instrumentation for electronic circuit and device characterization, with particular emphasis on instrumentation to be used in fundamental research activities and in the electronic industry.

Course programme

Instrumentation for noise measurements in electronic devices and circuits
Noise power spectral density measurements in semiconductor devices. Instrumentation for noise power spectral density measurements in MOSFETs, JFETs and BJTs.

Instrumentation for charge measurement in capacitive detector systems
Charge measurement from capacitive detectors. Equivalent noise charge (ENC). Equivalent noise charge measurement in electronic circuits processing the signal from capacitive sources.

Instrumentation for stativ and signal measurements in semiconductor devices
Turn-on and turn-off times in diodes. Solid state device characterization with a semiconductor Parameter Analyzer (HP 4145B).

Automatic instrumentation for impedance measurement
LCR Impedance Analyzer (HP 4284A Precision LCR Meter).

Signal generators
AM/FM radio-frequency generators, phase-locked-loop (PLL) circuits, frequency synthesizers, analog and digital pulse generators.

Frequency domain signal analysis
Analog real time (multichannel) and swept-frequency (swept-tuned, superheterodyne) spectrum analyzers (HP 4195A). Digital (FFT-based) spectrum analyzer (HP 3265A). Applications, general performance.

Time domain signal analysis
Sampling oscilloscope, digital storage oscilloscope (DSO). Time domain reflectometry.

Instrumentation for AC voltage measurement
Characteristic parameters of particular waveforms, AC voltage measurement (average, peak and root mean square value AC-DC converters), instrumentation amplifier.

Instrumentation for time interval measurement
Application examples, systematic dependence of the firing delay on the signal characteristics, time-over-threshold methods for charge measurement in capacitive detector systems, noise effects on charge measurement accuracy.

Devices for charge measurement in imaging and tracking applications
Operating principle of CMOS monolithic pixels. Passive monolithic pixels (PPS), active monolithic pixels (APS), photogate and logarithmic pixels. Readout architectures for pixel matrices, readout time estimation.

Course entry requirements

Knowledge of the fundamentals covered by the courses of Elettronica I, Circuiti e Sistemi Elettronici, Electronic Measurements and Comunicazioni Elettriche is required.

Course structure and teaching

Lectures (hours/year in lecture theatre): 32
Practical class (hours/year in lecture theatre): 6
Practicals / Workshops (hours/year in lecture theatre): 12
Project work (hours/year in lecture theatre): 0

Suggested reading materials

C.F. Coombs. Electronic Instrument Handbook. McGraw-Hill, Inc, 2000.

J.J. Carr. Elements of Electronic Instrumentation and Meaurements. McGraw-Hill, Inc., 1996.

W.D. Cooper, A. D. Helfrick. Electronic Instrumentation and Meaurements Techniques. Prentice-Hall Intern., Inc., 1985.

B. Oliver, J. Cage. Electronic Measurements and Instrumentation. McGraw-Hill, 1971.

N. Kularatna. Digital and Analogue Instrumentation. IEE, 2003.

Slides on the course topics are available on the website http://eil.unipv.it/strumentelePV.

Testing and exams

Student knowledge will be assessed through a written examination. If requested, an additional oral exam can be taken.